Birkholz, Mario <br/><br/>
Thin film analysis by X-ray scattering 

 - Weinheim  Wiley-Vch  2006 
 - xxii,356p.  26 cm. PB 
<br/><br/><label>ISBN: </label>3527310525 
<br/><br/><label>Dewey Class. No.: </label>621.38152  / BIR